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The Development of Atomic Force Microscopes

References

  1. G. Binnig and H. Rohrer, Scanning Tunneling Microscopy—From Birth to Adolescence, Rev. of Mod. Phys, Vol 59, No. 3, Part 1 1987, P 615
  2. Uber Glatte und Ebenheit als physikalisches und physiologishes Problem, Gustev Shmalz, Verein Deutscher Ingenieure, Oct 12, 1929, pp. 1461-1467
  3. U.S. Patent 2,728,222
  4. UK Patent 2,009,409
  5. R. Young, J. Ward, F. Scire, The Topografiner: An Instrument for Measuring Surface Microtopography, Rev. Sci. Inst., Vol 43, No 7, p 999
  6. G. Binnig, H. Rohrer, Ch. Gerber, E. Weibel, Surface Studies by Scanning Tunneling Microscopy, Vol. 49, No 1, 1982, p 57
  7. G. Binnig, C.F. Quate, Ch. Geber, Atomic Force Microscope, Phys. Rev. Letters, Vol. 56, No 9, 1986 p 930
  8. Y. Martin, C.C. Williams, H.K. Wickramasinghe, Atomic Force Microscope-Force Mapping and Profiling on a sub 100-Å scale. J. Appl. Phys. Vol 61, No 10, 1987, p 4723

 
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