Pacific Nanotechnology Inc.

Atomic Force Microscopes - Tutorial Page

Measuring images with an atomic force microscope

Place a probe in the microscope and align the light lever sensing system.
With the X-Y sample and the optical microscope place the region of the sample that will be imaged directly under the AFM probe.
Engage the Z translation stage to bring the probe to the surface.
Start the scanning of the probe over the surface and view the image of the surface on the computer screen.
Save the image on a computer disk.