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Atomic Force Microscopes - Tutorial Page

Torsion Modes

In contact mode AFM it is possible to monitor the torsion motions of the cantilever as it is scanned across a surface.

Figure 9: Torsions of the cantilever are measured in the AFM. Changes in the torsion of the cantilever are an indication of changes in the surface chemical composition.

The amount of torsion of the cantilever is controlled by changes in topography as well as changes in surface chemical properties. If a surface is perfectly flat but has an interface between two different materials, it is often possible to image the change in material properties on a surface. This technique is similar to lateral force microscopy (LFM).