Dr. Paul West Publications

Paul E. West

Publications

1. Photochemical Production and Identification of cis-cis 1,3,5,7-Octatetraene (1982) J. Phys. Chem., 86, with B.E. Kohler and M. Hossain.
2. Emission and 1- and 2-photon Excitation Spectra for the 1Ag- 2Ag Origin Region of cis-cis 1,3,5,7-Octatetraene, J. Chem. Phys., 79(2), 583(1983) with B.E. Kohler.
3. Chemical Applications of Scanning Tunneling Microscopy, IBM J. Res. Dev., 30 484, September 1986, with J. Kramer, D.V. Baxter, R.J. Cave, and J.D. Baldeschwieler.
4. Barriers in the Excited 2Ag State of cis, trans Isomerizatoin of cis, cis- octatetraene: General Features of the Excited State Potential, J. Chem. Phys. 85(5), 4436(1986) with B.E. Kohler and P. Mitra.
5. An XPS Investigation of the Incorporation of Surface Oxides Into Bulk Zirconium, J. Vac. Sci. Tech. A, Vol 5, No. 4, pt. 2, July-Aug.(1987) pp 1124-7 with P.M. George.
6. Evidence for Schottkey Emission in Scanning Tunneling Microscopes Operated in Ambient Air, Appl. Phys. Lett. 52, 2086(1988) with J. Jahanmir, and T.H. Rhodin.
7. Surface Modifications of a-Si:H with a Scanning Tunneling Microscope. J. Appl. Phys. 65,2064(1989) with J. Jahanmir, S. Hsieh, and T.H. Rhodin.
8. Applications of STM Technologies, SPIE Vol. 1087 Integrated Circuit Metrology, Inspection, and Process Control III(1989) 407, with S. Henely.
9. Current-Voltage Characteristecs of Silicon Measured with the Scanning Tunneling Microscope in Air, J. Vac. Sci. Tech. A, 7,2741(1989) with J. Jahanmir, A. Young, and T.N. Rhodin.
10. Local Modifications of Thin SiO2 Films in a Scanning Tunneling Microscope, J. Appl. Phys. 67(11),(1990) with J. Jahanmir and P.C. Colter.
11. Comparison of Scanning Force Microscope and Scanning Electron Microscope Analysis of Poly-Silicon with G.D. Aden, R.T. Jobe and B. Roth, Scanning, 1991
12. Thermal Conductivity Contrast Imaging with A Scanning Thermal Microscope, Thermal Conductivity, 22, T.W. Wong(ed.), Technomics(1994) with R.B. Dinwiddie and R.J. Pylki.
13. Scanning Near-Field Optical Microscopy and Scanning Thermal Miroscopy, Jpn. J. Appl. Phys. Vol 33(1994) 3785 with R. Pylkki, P. Moyer.
14. In Situ AFM Study of the Surface Morphology of Polypyrolle Film, Synthetic Metals 74(1995) 127-131. With J. Li, E. Wang, M. Green.
15. Optimizing AC-Mode Atomic Force Microscopy, Scanning, Vol. 18, No 5(1996) 339-343, With H. Ho.
16. Development of a Scanning Tunneling Microscopy-based electron beam induced current (EBIC) microscope. Scanning Microscopy, vol. 10. no. 1, 33-38, with P. Koschinski, V. Dworak, and LJ Balk.
17. Atomic Steps With Tuning Fork Based non-Contact Atomic Force Microscopy, Submitted to J. Appl. Phys., Vol. 75, no. 11, 13 Sept 1999, With W.H.J. Rensen, A.G.T. Ruiter, N.F. van Hulst.
18. Silicon Single Atom Steps as AFM Height Standards, SPIE-Int. Soc. Opt. Eng. Proceedings of SPIE, Vol. 4344, 2001, 157-158 with R. Dixon, N. Orji, J. Fu, V. Tsai, E. Williams, T. Vorburger, H. Edwards, D. Cook, R. Nyffenegger.
19. Crystal sensor for microscopy applications, Appl. Phys. Let., TBP Jan. 5, 2005, with Z. Peng.
20. AFM capabilities in Characterization of Particulate Matter: from Angstroms to Microns, Proceedings of the 33 annual international waterborne, high-solids, and powder coating symposium, 307-320, February (2006) with N.Starostina.
21. Quantitative and qualitative nanopowder nanoparticle characterization with AFM, Proceedings of Advances in Powder Metallurgy & Particulate Materials, 2006 with N.Starostina.
22. Tip dilation and AFM capabilities in the nanoparticle characterization, Journal of Materials, in press (2007) with N.Starostina.

Instructional Publications

1. The Scanning Probe Microscope: A Powerful Tool for Visualizing the Micro World, American Laboratory, Feb. 1991, With J.Gill, and J. Baldeschwieler.
2. The Atomic Force Microscope: Extending Microscopy to the Subnanometer Range, International Laboratory, March 1992.
3. The Atomic Force Microscope: A New Era in Microscopy, EM Views, Issue 7, 1993.
4. Atomic Force Microscope Combined With a Scanning Electron Microscope, Japanese Electron Microscopy Society, 1994.
5. Growing Large by Seeing Small Things, Chemtech, Vol 24, No 1, 1994.
6. Inspecting Surfaces With a Sharp Stick: Scanning Probe Micrscopy - Past, Present, and Future, Mic. Today, Mar/Apr. 2003 pp 5-8.
7. Imaging: From video games to scanning probe microscopy AM LAB 35(16): 24 August 2003, with J Li.
8. How to Recognize and Avoid AFM Image Artifacts, Mic. Today, Vol 11, No. 3, May/June 2003, pp 20-26 with N. Starostina.
9. Practical Guide to AFM Probe Tips, Micro/Nano, Dec. 2003 with T. Nollin.
10. Atomic Force Microscopy, Adv. Mat. & Proc., Feb. 2004, pp 35 - 37, with N. Starostina.
11. SPM for everyone, Mat. Today, Mar 2004.
12. Choose the Right Combo of Sensors & Scanning Modes, Micro/Nano, Jan 2004 with T. Nollin.

United States Patents

1. Differential Force Balance Apparatus, #5,009,111.
2. High Resolution Electromechanical Translation Device, #4,968,914.
3. Scanning MicroMechanical Probe Control System, #4,925,857.
4. High Resolution Electro Mechanical Translation Device, #5,260,622.
5. Search Position Encoder, #5,257,024.
6. High Density Data Storage and Retrieval Device, #4,956,817.
7. Scanning Force Microscope with Integrated Optics and Cantilever Mount, #5,291,775.
8. Scanning Force Microscope, #5,317,960.
9. Scanning Force Microscope Using Synchronous Sampling Detection of an Oscillating Cantilever, #5,406,832.
10. Thermal Sensing Probe Microscope and Method for Measurement of Thermal Parameters of a Specimen, #5,441,343.
11. Scanning Probe Microscope Adaptable for use with a Scanning Electron Microscope, #5,510,615.
12. Synchronous Sampling Scanning Force Microscope, #5,507,179.
13. Scanning Probe Microscope Adaptable for use with a Scanning Electron Microscope, #5,455,420.
14. System for controlling X-Y-Z motion of a scanning probe microscope sample stage (application).
15. Oscillating Scanning Probe Microscope (application).
16. Environmental Cell for a Scanning Probe Microscope (application).

Committees:

1. National Institute of Standards and Technology: National Advanced Manufacturing Test-bed (NAMT) - External Review of Nanotechnolgy - 1994.
2. GRIP NanoManipulator Advisory Committe- University of North Carolina -1996.
3. National Nanotechnology Roadmap for The Next Decade - National Science Foundation - January 1999.
4. NNI Interagency Workshop on Instrumentation and Metrology for Nanotechnology - January 2004.

Other:

1. Lecturer, University of California-Irvine, 2005.