The Electrical Testing Chuck for the Nano-I™ can be used to apply an electrical potential on the surface of a sample in close proximity to the AFM probe.
Figure 1: AFM / Electrical Probe
Figure 2: Nano-I™ AFM Sample Puck
The Sample Puck for the Nano-I™ Atomic Force Microscope has a magnetic plate that can support up to three magnetically mounted three dimensional X, Y, and Z precision translators. There is a vacuum chuck that can support a 6” (152.4 mm) wafer that can be manually rotated 360 degrees. This product replaces the vacuum chuck that is shipped with the Nano-I™ AFM system.
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