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References

  1.  R. Young, J. Ward, F. Scire, The Topografiner: An Instrument for Measuring Surface Microtopography, Rev. Sci. Inst., Vol 43, No 7, p 999
  2. U.S. Patent  #4,359,892
  3. G. Binnig, H. Rohrer, Ch. Gerber, E. Weibel, Surface Studies by Scanning Tunneling Microscopy, Vol. 49, No 1, 1982, p 57
  4. G. Binnig, C.F. Quate, Ch. Geber, Atomic Force Microscope, Phys. Rev. Letters, Vol. 56, No 9, 1986 p 930
  5. Omicron, Gmbh.   The SPM CU Technical Reference Manual
  6. A. Hartoonian, E. Betzig, M. Isaacson, A. Lewis, Super-resolution fluorescence near-field scanning optical microscopy, Appl. Phys. Lett. 49(11), 15 Sept. 1986, p 674
  7. C. Lin, F.F. Fan, A.J. Bard, High Resolution Photoelectrochemical Etching of n-GaAs with the Scanning Electrochemical and Tunneling Microscope, J. Electro. Soc. Vol. 134, No. 4, 1987, p 1038

 
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