Pacific Nanotechnology Inc.
LabViewT for Control of PNI AFM products
Summary
Using LabView™ software we are able to control all of the functions in the
AFM microscope including the optical microscope, AFM Scanner, and X-Y sample
positioner. Such capabilities facilitate the development of unique methods with
the PNI AFM systems.
Acknowledgement
The original idea for using LabView™ with the PNI microscope came from Associate
Professor Jeremy Levy and Graduate Student Henry Zhu of the University of Pittsburgh.
Also, they provided us with information required to complete this project.
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