Introduction
Several advanced functions are possible with the Lithography, Probing, Move-n-Scan software(LPM) software package. This product includes the software and hardware for making the measurements. The advanced functions include: Modifications: Basic shapes such as lines, dots, and circles as well as images from bitmaps may be written on a surface. The writing technique may be potential, or force driven. Probing: With the probing option of the LPM software it is possible to place the probe at a specific location on a surface and make an electrical measurement. The initial capability for probing is I/V measurements. However, additional FCE measurements are easily added. Move n Scan: On the NanoI™ and NanoR™ AFM systems the several images may be imaged in sequence. The positions for measuring each of the images is selected using a software interface. Manipulation: Nano-scale objects may be moved across a surface with the AFM probe using the manipulation capability of the LPM software. Examples include moving nano-spheres and nanotubes.
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