Pacific Nanotechnology Inc.
  print now

Mounted Probes For Nano-R™ and Nano-I™

 

These mounted probes are designed for the Nano-R™ and Nano-I™ atomic force microscopes. Probes are made of silicon and each model number includes 10 probes.
Figure 1: Mounted Probe




Close Contact Mode Probes - Model # P-MCU-SICC-0


NanoWorld model # NCH probes are mounted on rectangular substrates. Each probe has a tip radius of less than 10 nanometers with the following specifications:


Technical Data
 Value
Range
Thickness
 4 μm
3.5 - 4.5
Mean Width
30 μm
25 - 35
Length
125 μm 120 - 130
Force Constant
42 N/m 21 - 78
Resonance Frequency
320 kHz
250 - 390










Contact Mode Probes - Model # P-MCU-SICT-0


NanoWorld model # CONT probes are mounted on rectangular substrates. Each probe has a tip radius of less than 10 nanometers with the following specifications:
Technical Data
 Value
Range
Thickness
 2 μm
1.5 - 2.5
Mean Width
50 μm
45 - 55
Length
450 μm 445 - 455
Force Constant
.2 N/m .07-.4
Resonance Frequency
13 kHz
9-17






 
3350 Scott Blvd. #29, Santa Clara, CA 95054  |  Phone: 1-800-246-3704  |  Direct: 408-982-9492  |  Fax: 408-982-9151
Copyright 2003 Pacific Nanotechnology, Inc. All Rights Reserved.