Mounted Probes For Nano-R™ and Nano-I™

These mounted probes are designed for the Nano-R™ and Nano-I™ atomic force microscopes. Probes are made of silicon and each model number includes 10 probes.

Figure 1: Mounted Probe

Close Contact Mode Probes - Model # P-MCU-SICC-0


NanoWorld model # NCH probes are mounted on rectangular substrates. Each probe has a tip radius of less than 10 nanometers with the following specifications:

Technical Data	Value	Range
Thickness	4 ?m	3.5 - 4.5
Mean Width	30 ?m	25 - 35
Length	125 ?m	120 - 130
Force Constant	42 N/m	21 - 78
Resonance Frequency	320 kHz	250 - 390