The Nano-I™ AFM
The Nano-I™ (Model #S-030-0000-1) is a complete high performance Atomic Force Microscope system that is optimized for imaging wafers and disks. Applications for the Nano-I™ include research, development, process development and process control. Included with the system are a master computer, software, electronic controller and an AFM stage. The automated X-Y stage accepts wafers up to eight inches in diameter and 0.5 inches thick. With this unique stage, it is possible to adjust the angle of the probe sample under computer control. Nano-I™ software runs on the industry standard Windows XP™ operating system. There are three software modules for acquiring and analyzing AFM images included with the Nano-I™ system:  Nano-I™ Atomic Force Microscope Enlarged EZMode™: For new users or users that want to use the Nano-I™ on an infrequent basis, EZMode™ software is ideal. EZMode™ software guides an operator through the essential steps for acquiring AFM images. X'Pert™: This acquisition software is designed for advanced users that want the flexibility to control all of the parameters in the Nano-I™ stage. Control of each parameter in the stage is available through a series of windows. Nano-Rule™: All of the important features required for rapidly visualizing and analyzing AFM images are included with the Nano-Rule™ software. Additionally, because Nano-Rule™ software was written for Windows XP™, it takes advantage of all the state of the art browsing and report generation features available in the XP environment.
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