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The Nano-IT Atomic Force Microscope

• The Nano-IT AFM
• The Nano-IT Stage
• Nano-IT Controller
• Nano-IT Software
• Nano-IT Specifications
• DVD Holders
• All sections (one page version)

Nano-IT Software

EZModeT Software Interface

•  Assure that a cantilever is in the Microscope.
• Start: Calibrate Scanner (optional): Select "linearize", then "scanner auto-linearity".
• Select Mode: Contact Mode or Vibrating Mode.
• Align Laser: Align the laser onto the cantilever.
• Frequency Sweep: Automatic peak detection for vibrating mode imaging. (only in vibrating mode)
• Stage: Move sample until desired scan area is under cantilever.
• Tip Approach: Activate the motors for approaching the sample with the probe.
• Scanner Sample: Set the scan size and scan parameters.
• Image Processing: Visualize and analyze images.
• Tip Retract: Withdraw tip when scan is complete.

X'PertT Software
Direct control of the available feature in an "interactive" mode is possible with the X'PertT software. Below is a view of the screen for X'PertT software:

X'PertT Software Interface

The menu items that are available in the X'PertT software are:

1. Setup: This window contains all of the control parameters for operating the microscope including scan ranges, PID settings, etc.
2. Tip: The tip button controls all aspects of the tip approach to the sample. The type of approach, rate of approach, and withdrawal are controlled.
3. Scanner Control: This window is used while scanning a sample. The window shows between 1 and 4 windows and has the scan size, speed, PID settings, and other scan parameters.
4. Force/Distance Window: Complete control of Force/Position curves is possible with the force position curve window.

Image Analysis
All of the commonly available image analysis techniques come as standard features with the Nano-IT AFM system. Functions that are available are:

• Histogram Adjust
• Image Level
• 3-D Display
• Line Profile
• Image Correct

Nano-IT Image Analysis Software
Each of the AFM image analysis software features is activated with an icon at the top of the analysis window. Software features include:

• Image Leveling: This window permits the removal of sample tilt from images. Removal methods include 3 point plane, polynomial plane fit, and 1D line leveling. User specified areas may be selected and excluded from the leveling process.
• Line Profiles: Several types of line profiles may be selected. They include Horizontal, Vertical, Oblique, Polygonal, Circular, and several line average. Up to four line profiles may be selected for analysis. Horizontal and Vertical distances may be calculated on the line scans.
• Histogram Analysis: The histogram analysis feature is useful for optimizing the display of AFM images. A region of the image histogram may be selected and used for the full pallet range of a displayed image.
• Filtering: Several filtering functions may be applied to an AFM image. Filter options include the blur function, a predetermined filter function, and a conventional kernel. It is possible to select areas of the image that are not included in the filter process.
• Fourier Filtering: A standard FFT function may be applied to an image.
• 3D Imaging: The 3-D imaging feature images may be viewed from several angles and perspectives. Simply dragging the mouse over the image changes the viewing angles.