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Printable version

The Nano-I™ Atomic Force Microscope

 

Nano-I™ Specifications

Stage Specifications:
Size16" W × 18.5" H × 25.25" D
Weight170 Lbs
Cables6 Feet
PowerFrom Electronic Controller

AFM Scanner Specifications:
X-Y ScanRange80 µm 
 Resolution2 nmCalibration Sensor on
  1 nmCalibration Sensors off
 Linearity1%Not Rotated
  2%Rotated
Z ScanRange8 µm 
 Z Noise0.13 nmCalibration sensors on
  0.07 nm

Calibration sensors off

 Sensor Linearity100 nm for 80 µm Scan (<0.2%)
Probe HandlingPre-mounted cantilevers on steel substrate
Module Size1" H × 4" W × 2.5" D
Optical View90° - 31 mm from top surface to cantilever45°

Sample Stage Specifications:
Vacuum rings2", 4", 6", 8"
Sample Thickness7mm
Sample Diameter< 8" with full access
< 12" with partial access
AttachmentVacuum

Translation Stage Specifications:
X Range4"
Y Range5"
X-Y Step Size4 µm
Z Range3/8"
Z step size.32 µm
Angle Adjustment

Video Microscope Specifications:
Magnification1000xViewed on 9" diag. monitor
Field of View140 µm × 190 µmFOV with max. zoom
Resolution1.5 µm 
Motorized ControlZoomDC Motor
FocusStepper Motor 
ZoomRatio 4 to1 
X-Y Lens Position1 mm × 1 mmManual control

Computer Specifications:
Processor>1000MHz
Hard Drive20 GB
CD52x
Memory256 Mb
Operating SystemWindows XP™

Controller Physical Specifications:
 Height(in.)Width(in.)Depth(in.)Weight(lbs.)
Electronic Unit17151535
Computer1781822
Monitor18161830

Control Unit Specifications:
Weight65 lbs.
Voltage115/230 VAC, 50/60 Hz
Current0.95/0.45 Amp
Temperature50-95°
Humidity5-60%, non-condensing
 
Every effort has been made to ensure the accuracy of the information contained in this brochure. However, technical data and specifications are subject to change without notice as a result of upgrading our products. Therefore, please inquire to verify all critical parameters.

This product is covered by US patents: #5,811,802 and #5,949,070.
 
 
 
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