Image Analysis
All of the commonly available image analysis techniques come as standard features with the Nano-R™ AFM system. Functions that are available are:
• Histogram Analysis
• Plane Correction
• Image Leveling
• Filter
• 3-D Imaging
• Fast Fourier Transform
• Line Profile
Each of the AFM image analysis software features is activated with an icon at the top of the analysis window.
Software Options
In addition to the software modules provided with the Nano-IMTM system, there are several optional software modules including:
• NanoRule+™
• Grain Analysis
• Particle Analysis
• LPM Software
• DVD
Specifications
Light Lever AFM / Scanner
| Force Sensor |
Light Lever |
| Detector |
4 Quadrant Photo-detector |
| Laser |
650 nm diode – 25 micron spot size |
| Laser Adjustment |
80 TPI |
| Probe Holder |
Universal Adapter |
| Probe Types |
Pre-mounted - Magnetic |
| XYZ Calibration Sensors |
Inductive – 1 nm resolution |
| Z Scanner Type |
Piezoelectric Ceramic – Direct |
| Z Range |
8 Microns |
| Z Noise |
<0.06 nm* |
| Z Linearity |
< 1 % |
| Z out of plane motion |
< +/- 30 nm |
| XY Scanner Type |
Flexure |
| XY Range |
90 Microns(180 or 360 microns optional) |
| XY Linearity |
< 1 % |
| XY Noise |
< 0.01 nm (open loop) |
| XY, XZ, YZ Crosstalk |
< 1 % |
| Probe Electrical Connector |
Isolated 5 Connector |
1624 Electronic Control
| Scan DAC |
16 Bits |
XYZ board – Primary and Secondary
• Digital Zoom/Offset
• Analog Zoom
• Z High Voltage
• Z Sample/Hold
• PID Control
• Phase/Amplitude
• XY High Voltage
• XY Sensor Feedback |
16 Bits
4 bits on High Voltage
-20 to 140 Volts
20 Bits
Analog
400 Mhz Clock/32 Bit Frequency Control
+X,-X +Y,-Y (-20 to 140 Volts)
Analog PID Control |
| User Access |
Connector for Signal Access Console |
Internal Digital Control
• CPU
• Operating System
• Communications Protocol
• Memory |
Pentium
Linux
TCP/IP
RAM/Disk Drive |
Motor Driver Board
• Number of Motor Drivers
• Motor Type
• Control
• Additional Function |
7
Stepper
Microprocessor
Light Intensity Control |
Stage
XY Stage Range
• X
• Y |
150 mm
150 mm |
| XY Stage Step Size |
4 um |
| XY Stage Accuracy |
< 10 um |
| Z Motor Range |
8 mm |
| Z Motor Step Size |
162 nm |
Sample Puck
• Hold Down
• Height
• Maximum Sample Diameter |
Magnetic
30 mm
100 mm |
Optical Microscope
• Resolution
• Zoom Ratio
• Field of View |
1.5 u
4:1
140 x 190 u at Maximum Zoom |
| Probe Exchange |
Flip Up |
| Physical Specifications |
| Width |
Depth |
Height |
Weight (kg) |
|
• Stage
• Vibration Enclosure
• Electronic Controller
• Work Station |
| 14 |
19 |
16 |
50 |
| 31 |
33 |
56 |
275 |
| 12 |
18 |
22 |
22 |
| 7 |
16 |
16 |
14 |
|
Control Station
| Computer Monitor |
19” LCD |
| Video Monitor |
19” LCD |
| Accessories |
Mouse, Keyboard, Trackball |
Computer:
• Type
• Operating System
• Memory
• Disk Drive
AFM Software:
• Acquisition
• Display
Video Converter |
IBM PC
Microsoft Vista
> 1 Gigabyte
> 200 G Bytes
EZ Mode™, X’ert™ Mode
AFM Analysis, and NanoRule+™
NTSC – SVGA |
Sample Stage
| Vacuum Rings |
2” (50.8 mm), 4” (101.59 mm),
6” (152.39 mm) |
| Sample Thickness |
< 0.3” (8 mm) |
| Sample Diameter |
6” (150 mm) full, < 12” (304.8 mm) partial |
| Attachment |
Vacuum |
