The Nano-R™ Atomic Force Microscope

Nano-R™ Specifications

X-Y Scan:: Range: 80 µm
Linearity: 1%
Resolution: 0.1 nm
Z-Scan:: Range: 8 µm
Resolution: 0.1 nm
Z Noise: 0.13 nm Calibration sensors on
0.07 nm Calibration sensors off
Color Video Microscope:: Magnification (9" monitor): 1000x
Motorized Zoom/Focus: 4x
Field of View: 140 µm x 190 µm
Resolution: 1.5 µm
Automated X-Y Stage:: Range: 25.4 x 25.4 mm
Step Size: 3 µm
Slew Rate: 1.2 mm/sec.
Scan Modes:: — Contact Mode
— Lateral Force Mode
— Close-Contact Mode
— Non-Contact Mode
— Material Sensing Mode
— Force/Distance Mode
Master Computer:: CPU >1 GHz
CPU Hard Drive >20GB
RAM Memory 256 MB
Physical Specifications: (in./lbs.)