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The Nano-RT Atomic Force Microscope

Nano-RT Specifications

X-Y Scan:
Range: 80 µm
Linearity: 1%
Resolution: 0.1 nm
Z-Scan:
Range: 8 µm
Resolution: 0.1 nm
Z Noise: 0.13 nm Calibration sensors on
              0.07 nm Calibration sensors off
Color Video Microscope:
Magnification (9" monitor): 1000x
Motorized Zoom/Focus: 4x
Field of View: 140 µm x 190 µm
Resolution: 1.5 µm
Automated X-Y Stage:
Range: 25.4 x 25.4 mm
Step Size: 3 µm
Slew Rate: 1.2 mm/sec.
Scan Modes:
- Contact Mode
- Lateral Force Mode
- Close-Contact Mode
- Non-Contact Mode
- Material Sensing Mode
- Force/Distance Mode
Master Computer:
CPU >1 GHz
CPU Hard Drive >20GB
RAM Memory 256 MB
Physical Specifications: (in./lbs.)


HeightWidthDepthWeight
Stage151516122
Controller15151735
Computer1781822
Monitor18161830

 
3350 Scott Blvd. #29, Santa Clara, CA 95054  |  Phone: 1-800-246-3704  |  Direct: 408-982-9492  |  Fax: 408-982-9151
Copyright 2003 Pacific Nanotechnology, Inc. All Rights Reserved.