Pacific Nanotechnology Inc.
The Nano-RT Atomic Force Microscope
Nano-RT Stage
The Nano-RT AFM stage (Figure 1 shown at the left) is a tabletop unit and can be operated with high resolution results in a normal laboratory environment. The stage is optimized for rapidly exchanging samples and probes. Once a sample is placed in the stage placing the probe above the sample is rapidly done with the automated X-Y stage and the high resolution video microscope. Inside the Nano-RT AFM stage are the AFM scanner, X-Y positioning stage and a video microscope. Cables are attached to the stage in the rear.
Figure 1: The Nano-RT Stage
The AFM Scanner
The Nano-RT AFM scanner (Figure 2) uses the standard light lever method for monitoring the motion of a cantilever as it is raster scanned across a surface. The scanner is a patented, compact design that offers a direct internal scanner calibration and a hollow pivot scanner that facilitates a direct view with a video microscope. Alignment of the AFM sensor is achieved with four adjustment screws that are easily accessed at the front of the AFM head. Two of the adjustments move the laser onto the cantilever and two of the adjustments move the photo-detector into the path of the reflected laser beam.
Figure 2: Nano-RT AFM Scanner
The Sample Holder
The Nano-RT sample holder facilitates the rapid introduction of a sample to the microscope stage. The holder can accommodate a large variety of sample sizes. The standard sample holder is for standard magnetic disks.
Figure 3: Nano-RT Sample Puck
The Nano-RT multiple thickness puck is designed to accommodate samples of several thicknesses. The puck is made from several ¼" (6.35 mm) thick metal plates that are each 2" (50.8 mm) in diameter. The bottom plate slides into the Nano-RT X-Y positioner. The remaining plates (up to four) may be attached to the bottom plate with screws. Each of the plates has a magnet at its center for securing a sample onto the puck.
| Config. | Thickness | Total Height | Sample Thickness Range |
|---|
| Base | 0.25" (6.35 mm) | 0.25" (6.35 mm) | 1.00" - 1.30" (25.40 mm - 33.02 mm) |
| 1 Plate | 0.25" (6.35 mm) | 0.50" (12.70 mm) | 0.75" - 1.05" (19.05 mm - 26.67 mm) |
| 2 Plates | 0.25" (6.35 mm) | 0.75" (19.05 mm) | 0.50" - 0.80" (12.70 mm - 20.32 mm) |
| 3 Plates | 0.25" (6.35 mm) | 1.00" (25.40 mm) | 0.25" - 0.55" (06.35 mm - 13.97 mm) |
| 4 Plates | 0.25" (6.35 mm) | 1.25" (31.75 mm) | 0.00" - 0.30" (00.00 mm - 7.62 mm) |
There are several
optional sample holders for the Nano-RT. Additionally, customers can fabricate their own sample "pucks". The maximum sample size that the Nano-RT stage can hold is 3½" × 3½".
Automated X-Y Translation Stage
The motorized X-Y positioning stage is used for moving the sample on the "puck" under the AFM probe. The X-Y positioning stage may be activated from a window on the master computer, or it may be activated from a "track ball".
Video Optical Microscope
A color video microscope is essential in an AFM for locating features on a surface for scanning. The Nano-RT AFM has a motorized zoom and focus video microscope that is controlled by either software or the system's trackball. There is a manual control of the X-Y position of the microscope objective for centering the image of the cantilever in the video microscope image.
Figure 4: Optical microscope image of an AFM cantilever in the Nano-RT
Probe Exchange Mechanism The Nano-RT has a unique
probe exchange mechanism that does not require that the AFM scanner be removed from the AFM stage. There is no chance of the AFM scanner being dropped and damaged when using the probe exchange mechanism.
Figure 5: Probe exchange mechanism
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