The Nano-RT has a unique probe exchange mechanism that does not require that the AFM scanner be removed from the AFM stage. There is no chance of the AFM scanner being dropped and damaged with the probe exchange mechanism
The Nano-RT is shown here imaging the cross section of a sample. The sample is mounted on the versatile AFM puck.
To exchange the AFM probe, the sample puck is removed from the AFM stage. The knobs at the left and right are rotated to release the AFM head from the stage.
The AFM scanner can then be rotated so that the AFM probe can be accessed and easily exchanged.
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