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May 2008 Image of the Month...

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Nano-R™ SPM

Image Analysis

All of the commonly available image analysis techniques come as standard features with the Nano-R™ AFM system.

Functions that are available are:

• Histogram Analysis
• Plane Correction
• Image Leveling
• Filter
• 3-D Imaging
• Fast Fourier Transform
• Line Profile

Each of the AFM image analysis software features is activated with an icon at the top of the analysis window.

Plane Correction: This window permits the removal of sample tilt from images. Removal methods include 3 point plane, polynomial plane fit, and 1D line leveling. User specified areas may be selected and excluded from the leveling process.

Histogram Analysis: The Histogram Analysis feature is useful for optimizing the display of AFM images. A region of the image histogram may be selected and used for the full palette range of a displayed image.

Filtering: Several filtering functions may be applied to an AFM image. Filter options include the blur function, a predetermined filter function, and a conventional kernel. It is possible to select areas of the image that are not included in the filter process.

Fast Fourier Transform: Choose contact or vibrating mode to perform a standard Fast Fourier Transform (FFT) function that may be applied to an image.

3D Imaging: The 3D imaging features may be viewed from several angles and perspectives. Viewing angles are changed by simply dragging the mouse over the image.

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