Rapid Scanning
AFM for Education
May 2008 Image of the Month...
Home
About Us
Products
Our Customers
News & Events
Applications
General
Biosensors
Defect Inspection
Nano Roughness
DVD Analysis
Nanostructures
Metallurgy
Polymers
NanoTribology
Membrane Analysis
Nanoparticles
Paper Analysis
Applications Snapshots
Gallery
Technology
Image Contest
Developer's Corner
Contact
Careers
Newsletter
AFM University Nanoparticles
AFM University Nanoparticles
Probe Store
Probe Store
home inquire newsletter search site map
 
Printable version PDF-format version

AFM for Nano-Surface Texture/Roughness

 

Sources of Error in Area/Surface Roughness Measurements

There are two primary potential sources of error in using an AFM for measuring surface textures. The first is the probe geometry and the second is the length scale of the measurement.
Probe Geometry:
The surface texture that is measured with an AFM depends on the geometry of the probe tip. If the probe tip is larger than the features causing the surface texture, then the surface roughness measurements will appear smaller than they should be. This possible source of error is avoided by using the sharpest possible probe.
Length Scale:
Within the image used for the surface/area roughness calculation there must be an adequate sampling of the features giving rise to the surface texture. As a result, it is possible to get a different surface texture when the scan size is changed. This problem is avoided by using the same size scan range when surface roughness on several samples is being compared.
 
 
 
© Copyright 2002 -2007 Pacific Nanotechnology, Inc. All Rights Reserved.
No part of this site can be copied without prior agreement with Pacific Nanotechnology.