Atomic Force Microscopy for Nanoparticles

Nanoparticles, a unique subset of the broad field of nanotechnology, include any type of particle with at least one dimension of less than 500 nanometers. Nanoparticles play an important role in a wide variety of fields including advanced materials, pharmaceuticals, and environmental detection and monitoring.

The atomic force microscope (AFM) is ideally suited for characterizing nanoparticles. It offers the capability of 3D visualization and both qualitative and quantitative information on many physical properties including size, morphology, surface texture and roughness. Statistical information, including size, surface area, and volume distributions, can be determined as well. A wide range of particle sizes can be characterized in the same scan, from 1 nanometer to 8 micrometers. In addition, the AFM can characterize nanoparticles in multiple mediums including ambient air, controlled environments, and even liquid dispersions.