Atomic Force Microscopy for Nanoparticles

In many industries, the ability to scan from the nanometer range into the micron range is important. With AFM, particles anywhere from 1nm to 8mm in height can be measured in a single scan.

It is important to note that AFM scanning is done physically with a probe time in constant or intermediate contact. Therefore, particles must be pushed against a 2D surface during the scan. With the NANO-RTM, the maximum 2D scan range for a single scan is 80mm × 80mm. Multiple scans can be performed, however, to provide greater statistical accuracy.

Key attributes of AFM for characterization of nanoparticles:

Qualitative analysis:

• 3D visualization
• Material sensing

Quantitative analysis:

• Size
• Morphology
• Surface texture/roughness parameters
• Statistical information
• Particle counting
• Size distribution
• Surface area distribution
• Volume & mass distributions
• Spatial distribution

Mediums:

• Gas
• Ambient air
• Controlled environments
• Liquid dispersions
• Solid dispersions

Range:

• Particle size: 1nm to 8mm
• Scan range: up to 80mm