Pacific Nanotechnology Inc. - Printable version

The Nano-R™ Multiple Thickness Puck is designed to accommodate samples of several thicknesses. The puck is made from five ¼" (6.35 mm) thick metal plates that are each 2" (50.8mm) in diameter. The bottom plate slides into the Nano-R™ X-Y positioner and the remaining plates (up to four) may be attached to the bottom plate with screws. Each of the plates has a magnet at its center for securing a sample onto the puck.

Configuration	Thickness	Total Height	Sample Thickness Range

Base	0.25” (6.35 mm)	0.25” (6.35 mm)	1.0” - 1.3” (25.4 mm - 33.02 mm)
1 Plate	0.25” (6.35 mm)	0.50” (12.7 mm)	0.75” - 1.05” (19.05 mm - 26.67 mm)
2 Plates	0.25” (6.35 mm)	0.75” (19.05 mm)	0.50” - 0.80” (12.7 mm - 20.32 mm)
3 Plates	0.25” (6.35 mm)	1.00” (25.4 mm)	.025” - 0.55” (6.35 mm - 13.97 mm)
4 Plates	0.25” (6.35 mm)	1.25” (31.75 mm)	0.0” - 0.33” (0.00 mm - 8.5 mm)

The Nano-R™ AFM sample puck is modified to hold the sample cylinders for the MTS nanoindentation instruments. Two sizes of MTS sample cylinders are supported: 1) ½" (12 mm), and 2) ¾" (19 mm) diameters. After the MTS sample cylinder is placed in the PNI sample puck, a setscrew is used to hold the MTS aluminum cylinder in place. This puck is used in place of the standard puck shipped with the Nano-R™ AFM.

The Electrical Testing Chuck for the Nano-R™ can be used to apply an electrical potential on the surface of a sample in close proximity to the AFM probe.

This sample puck for the Nano-R™ Atomic Force Microscope has a three dimensional X, Y, and Z precision stage. On the stage is a mounting hole that allows the support of a probe that can be used to apply an electric potential to a sample. The entire top of the puck is magnetized for holding samples.

X, Y, Z Stage Specificatiions
Range	5 mm
Resolution	5 microns

Nano-R™ Sample Pucks