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Nano-R™ Sample Pucks

 
Multiple Thickness

The Nano-R™ Multiple Thickness Puck is designed to accommodate samples of several thicknesses. The puck is made from five ¼" (6.35 mm) thick metal plates that are each 2" (50.8mm) in diameter. The bottom plate slides into the Nano-R™ X-Y positioner and the remaining plates (up to four) may be attached to the bottom plate with screws. Each of the plates has a magnet at its center for securing a sample onto the puck.




Configuration
Thickness
Total Height
Sample Thickness Range
       
Base
0.25”
(6.35 mm)
0.25”
(6.35 mm)
1.0” - 1.3”
(25.4 mm - 33.02 mm)
1 Plate
0.25”
(6.35 mm)
0.50”
(12.7 mm)
0.75” - 1.05”
(19.05 mm - 26.67 mm)
2 Plates
0.25”
(6.35 mm)
0.75”
(19.05 mm)
0.50” - 0.80”
(12.7 mm - 20.32 mm)
3 Plates
0.25”
(6.35 mm)
1.00”
(25.4 mm)
.025” - 0.55”
(6.35 mm - 13.97 mm)
4 Plates
0.25”
(6.35 mm)
1.25”
(31.75 mm)
0.0” - 0.33”
(0.00 mm - 8.5 mm)
       



MTS Sample Holder


The Nano-R™ AFM sample puck is modified to hold the sample cylinders for the MTS nanoindentation instruments. Two sizes of MTS sample cylinders are supported: 1) ½" (12 mm), and 2) ¾" (19 mm) diameters. After the MTS sample cylinder is placed in the PNI sample puck, a setscrew is used to hold the MTS aluminum cylinder in place. This puck is used in place of the standard puck shipped with the Nano-R™ AFM.




Electrical Testing Chuck

The Electrical Testing Chuck for the Nano-R™ can be used to apply an electrical potential on the surface of a sample in close proximity to the AFM probe.






This sample puck for the Nano-R™ Atomic Force Microscope has a three dimensional X, Y, and Z precision stage. On the stage is a mounting hole that allows the support of a probe that can be used to apply an electric potential to a sample. The entire top of the puck is magnetized for holding samples.

X, Y, Z Stage Specificatiions
Range
5 mm
Resolution
5 microns


 
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