The atomic force microscope is capable of measuring surfaces topography as well as surface physical properties including surface potential, surface magnetic fields, and surface conductivity. “ An introduction to AFM Modes” authored by Paul West and Arthur Ross gives a theoretical and practical guide to help understand the capabilities of AFM modes.
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Each month Pacific Nanotechnology will post an AFM image on its web site. A prize will be awarded to the person that is able to correctly identify the sample used to create the AFM image. The prize this month is an iPod nano.