Conclusion
The AFM is emerging as an important tool for characterizing and studying the micron and submicron topography and properties of paper coatings. Specific applications include the direct visualization of paper coatings, quantitative analysis of paper coatings, and the measurement of particle dispersion. Advantages of the AFM over the SEM are:
The AFM provides direct three-dimensional images
The AFM does not require sample preparation
The AFM can work in ambient conditions
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