Products

• The Nano-RT Atomic Force Microscope
• The Nano-IT Atomic Force Microscope
• NanoRule+T Software Analysis Package
• AFM reference
• Lithography, Probing, Move-n-scan Software Package
• Crystal Scanner
• Pacific Nanotechnology Training Schedule - 2005

Nano-RT SPM
The Nano-RT SPM is optimized for research and development applications. It may be purchased with both the light lever AFM scanner and the crystal scanner.

Nano-IT SPM
Wafers and discs are accommodated on the stage of the Nano-IT SPM system. The motorized stage has a range of 4" X 5" and samples can be rotated 360 degrees.

Light Lever AFM Scanner
Both the Nano-RT and Nano-IT SPM system may be purchased with the LL AFM scanner. This scanner uses the traditional force sensor technology and is used for measuring topography and modes.

Crystal Scanner
The Crystal Scanner uses advance force sensing technology and is ideal for SPM metrology measurements and for customers that want an extremely easy to use SPM system.