The Nano-IM™ 6x6 is a complete high performance AFM system that is optimized
for imaging wafers and disks. Applications for the Nano-IM™ 6x6 include research, development, process
development and process control.
Both the Nano-R™ and Nano-I™ SPM system may be purchased with the LL AFM scanner. This scanner uses the traditional force sensor technology and is used for measuring topography and modes
The Crystal Scanner uses advance force sensing technology and is ideal for SPM metrology measurements and for customers that want an extremely easy to use SPM system
NanoRule+ Grain Analysis
Particle Analysis
Optical Disc Analysis
WIMS Software
Options for Nano-R™ Environmental Cell – (Nano-R™)
LPM Software – (Nano-R™ and Nano-I™)
Signal Access Console – (Nano-R™ and Nano-I™)
Heating Stage –( Nano-R™)
Nano-R™ Pucks – (Nano-R™)
AFM/Optical Reference – (Nano-R™ and Nano-I™)
DVD Holders
Electrical Testing Chuck
STM Option for Nano-R™
