The PTrak3™ AFM head is designed for integration into many types of instrumentation and is useful for almost all AFM applications. It is very modular and has mounting brackets on its sides so that it can be used with many types of probe approach systems. Also, the probe is directly viewed with an optical microscope. Electrical connections to the PTrak3™ AFM head sensor and scanner are through an industry standard 25 pin sub-D female connector. External calibration sensors have special low noise connectors.
At the end of the Z scanner is piezoelectric ceramic that can be used for vibrating the AFM cantilever. The cantilever is mounted to the AFM head using pre-mounted cantilevers. Threaded mounting holes for attaching a probe approach mechanism are located at the back and on the sides of the PTrak3™ AFM head.
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| Scanner Specifications: |
| Scan Range |
> 80 x 80 |
Microns
Z Range |
> 8 Microns |
| Resolution |
Controller/Environment Dependent |
| Calibration Sensors |
X, Y, Z Axis |
| Size |
25 mm X 102 mm X 64 mm |
| Top View Optical Distance |
31 mm |
| Electronic Scanner |
0-140 Volt (Tripod) |
| Sensor |
4 Section Photo-Detector |
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1. |
Y-Piezo Voltage |
9. |
Z- Piezo Return 2 |
2. |
X-Piezo Voltage |
10. |
Laser Power |
3. |
Z-Piezo Voltage |
11. |
Ground |
4. |
+ 15 Volts DC |
12. |
Detector T/L |
5. |
- 15 Volts DC |
13. |
Detector T/R |
6. |
Y-Piezo Return |
14. |
Detector B/L |
7. |
X-Piezo Return |
15. |
Detector B/R |
8. |
Z- Piezo Return |
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