Pacific Nanotechnology Inc.
Guide to AFM standards and references
Introduction
Standards and references are required for proper operation of an AFM and to verify optimal operating conditions and calibration of the instruments. Standards are used to assure that the absolute measurements are correct, while references assure that the instrument is giving consistent results.
For establishing calibrated topography measurements, the AFM scanner must be certified with calibration standards having pre-established dimensions in the X, Y and Z axis. References can be used for establishing that an AFM mode is operating correctly and for establishing the proper operation of the AFM.
This guide serves as a reference for finding standards and references that are helpful for making meaningful measurements with an AFM. When possible several vendors for a particular type of standard are listed.